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Scanning Electron Microscope

JOEL JSM‐7600F Scanning Electron Microscope (SEM)

The JSM‐7600F is a state‐of‐the‐art thermal FE‐SEM that successfully combines ultra‐high resolution imaging with optimized analytical functionality. In addition, the JSM‐7600F incorporates a large specimen chamber. This uniquely designed chamber, which accommodates a 200 mm diameter specimen, is optimized for a large variety of detectors for secondary electrons, backscattered electrons, EDS, WDS, EBSD, CL, etc

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Scanning Electron Microscope