Changing World of Electron Microscopy – Dr Oikawa

Profile of Speaker

Name : Dr Tetsuo Oikawa

Nationality : Japanese

Phd  Thesis : Image formation of cluster atoms in High Resolution Electron Microscopy - Kohakuin University - Japan

Current Occupation : Visiting Professor at Paris Universty / Director of JEOL - Europe Application Group - France.

Title of Presentation : The Changing World of Electron Microscopy

Duration : 45 minutes.

Q & A : 15 minutes .

Abstract of Presentation : 

As the design and fabrication of devices shrinks to the nanoscale and the world facing new challenges every day, scientists desperately need the ability to see what they have created. 

The Electron Microscope has enabled the human eye to see how atoms work in materials reactions at the ?ngstrom scale .

Modifications to the instrument have formed the technical foundation for major new scientific initiatives in nanomaterials research for use in everything from nanoelectronics, catalysis, medical science and engineering  by providing a fundamental understanding of surface structure modifications and their role in property-altering surface reactions.

Hence the Electron Microscope has become an essential tool for scientists all over the world who would like to achieve results which were un imaginable a few decades ago.

However these machines are much more than just microscopes, but serve as a platform for dynamic experiments, in which researchers can observe changes as they occur, characterize changes and also be able to modify and build structures.

Issues that would be  discussed in the presentation :

1)Enhancement of Electron Microscopy Imaging  to meet Nano resolution  structures using  Aberration Correctors and its theory

2) X Ray Analysis  used in Materials Characterization and its Theory

3) Electron Energy Loss Spectroscopy ( EELS)  in  Electron Microscopy where the inelastic scattering of electrons from surfaces is utilized to study electronic excitations or vibrational modes of the

   surface or of molecules adsorbed to a surface and its theory.

4) High Resolution STEM Nano Diffraction Techniques  for structural analysis of Nano Particles and its theory.

5) An Introduction to the technique 3D Nano Imaging  and Tomography .

The presentation would include high resolution image and application data related to a broad spectrum of samples ranging from Carbon Nano Tubes , Metals, Polymers,  Ceramics and Semic Conductor Devices.