Calculation of the capacity of reflection of multi-layer nanometric (Pt/C) and (Ni/C) in the field of x-rays

A. Meddour¹  and  R. Azizi²

1: Laboratory of the semiconductors, university Badji Mokhtar of Annaba, Algeria

E-mail: a_meddour@yahoo.fr

Fax : 00 213 37 20 02 64

Tél : 07 71 95 92 00

2: University of May 8th, 45 of Guelma, Algeria.

E-mail: azizi_r@gmail.com

Fax : 00 213 37 20 02 64

ABSTRACT

We simulated the capacity of reflection of multi-layer nanometric in the field of x-rays. Simulation is based on the theory of Abeles which models a thin layer by a square matrix containing the characteristics of the thin layers composing the multi-layer one. The parameters of multi-layer such as the thicknesses of the thin layers and the number of periods in stacking are optimized in order to obtain a maximum reflection. The considered intensity is corrected by taking account of the effect of roughnesses of surface. We noted that the value of the reflection depended primarily on the choice of materials forming the multi-layer one as well as its size. The study carried out within the framework of this work related to the multi-layer systems: (Pt/C) and (Ni/C).    

Key words:  Multi-layer, x-ray, reflection, simulation, nano materials.

Pr. Meddour Athmane,: University of Guelma, PB 401, 24000, Guelma, Algeria.

Fax: 00 213 37 20 02 64

Tel: 07 71 95 92 00